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Scanning Electron Microscopy

Language EnglishEnglish
Book Hardback
Book Scanning Electron Microscopy Lisa Page
Libristo code: 12434612
Publishers NY RESEARCH PRESS, March 2015
Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments empl... Full description
? points 289 b
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Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical aspects. Numerous topics are organized under two sections, "Material Science" and "Nanostructured Materials for Electronic Industry". This book includes contributions by renowned researchers and experts in this field.

About the book

Full name Scanning Electron Microscopy
Author Lisa Page
Language English
Binding Book - Hardback
Date of issue 2015
Number of pages 292
EAN 9781632384065
ISBN 163238406X
Libristo code 12434612
Publishers NY RESEARCH PRESS
Weight 572
Dimensions 236 x 162 x 23

Categories

Mathematics & Science > Science: general issues > Scientific equipment, experiments & techniques
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