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Electromigration and Electronic Device Degradation
Language
English
English
Book
Hardback
Electromigration is a mass transport effect in metals under high current densities, which causes the...
Full description
Libristo code: 04892340
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706 b
706 b
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Electromigration is a mass transport effect in metals under high current densities, which causes the metal atoms to migrate away from a high current density point and leads to the failure of integrated circuits. It is therefore an important reliability issue. This study reviews the topic for both the silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details, including an investigation of temperature dependence.
About the book
Full name
Electromigration and Electronic Device Degradation
Author
Christou
Language
English
English
Binding
Book - Hardback
Date of issue
1994
Number of pages
344
EAN
9780471584896
ISBN
0471584894
Libristo code
04892340
Publishers
John Wiley & Sons Inc
Weight
656
Dimensions
164 x 239 x 25
Categories
Technology, Engineering, Agriculture
>
Mechanical engineering & materials
>
Production engineering
>
Reliability engineering
Technology, Engineering, Agriculture
>
Electronics & communications engineering
>
Electronics engineering
>
Electronics: circuits & components
